Cluster Secondary Ion Mass Spectrometry: Principles and by Dominic M. Desiderio, Nico M. M. Nibbering, Joseph A.

By Dominic M. Desiderio, Nico M. M. Nibbering, Joseph A. Loo(eds.)

Explores the impression of the newest breakthroughs in cluster SIMS technology

Cluster secondary ion mass spectrometry (SIMS) is a excessive spatial answer imaging mass spectrometry procedure, which are used to signify the 3-dimensional chemical constitution in advanced natural and molecular platforms. it really works through the use of a cluster ion resource to sputter desorb fabric from an exceptional pattern floor. sooner than the arrival of the cluster resource, SIMS used to be seriously constrained in its skill to signify delicate samples due to harm from the atomic resource. Molecular samples have been basically destroyed in the course of research, proscribing the method's sensitivity and precluding compositional intensity profiling. using new and rising cluster ion beam applied sciences has all yet eradicated those boundaries, allowing researchers to go into into new fields as soon as thought of not possible by way of the SIMS procedure.

With contributions from prime mass spectrometry researchers around the globe, Cluster Secondary Ion Mass Spectrometry: rules and Applications describes the newest breakthroughs in instrumentation, and addresses top practices in cluster SIMS research. It serves as a compendium of information on natural and polymeric floor and in-depth characterization utilizing cluster ion beams. It covers issues starting from the basics and conception of cluster SIMS, to the real chemistries in the back of the luck of the method, in addition to the wide-ranging functions of the know-how. Examples of topics lined comprise:

  • Cluster SIMS conception and modeling
  • Cluster ion resource kinds and function expectations
  • Cluster ion beams for floor research experiments
  • Molecular intensity profiling and three-D research with cluster ion beams
  • Specialty functions starting from organic samples research to semiconductors/metals analysis
  • Future demanding situations and clients for cluster SIMS

This ebook is meant to learn any scientist, starting from commencing to complicated in point, with lots of figures to assist higher comprehend advanced strategies and methods. furthermore, every one bankruptcy ends with an in depth reference set to the first literature, facilitating extra learn into person subject matters the place wanted. Cluster Secondary Ion Mass Spectrometry: ideas and Applications is a must have learn for any researcher within the floor research and/or imaging mass spectrometry fields.Content:
Chapter 1 An advent to Cluster Secondary Ion Mass Spectrometry (Cluster SIMS) (pages 1–11): Christine M. Mahoney and Greg Gillen
Chapter 2 Cluster SIMS of natural fabrics: Theoretical Insights (pages 13–55): Arnaud Delcorte, Oscar A. Restrepo and Bartlomiej Czerwinski
Chapter three Ion assets Used for Secondary Ion Mass Spectrometry (pages 57–75): Albert J. Fahey
Chapter four floor research of natural fabrics with Polyatomic basic Ion resources (pages 77–116): Christine M. Mahoney
Chapter five Molecular intensity Profiling with Cluster Ion Beams (pages 117–205): Christine M. Mahoney and Andreas Wucher
Chapter 6 Three?Dimensional Imaging with Cluster Ion Beams (pages 207–246): Andreas Wucher, Gregory L. Fisher and Christine M. Mahoney
Chapter 7 Cluster Secondary Ion Mass Spectrometry (SIMS) For Semiconductor and Metals intensity Profiling (pages 247–268): Greg Gillen and Joe Bennett
Chapter eight Cluster TOF?SIMS Imaging and the Characterization of organic fabrics (pages 269–312): John Vickerman and Nick Winograd
Chapter nine destiny demanding situations and customers of Cluster SIMS (pages 313–327): Peter Williams and Christine M. Mahoney

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Explores the impression of the newest breakthroughs in cluster SIMS technologyCluster secondary ion mass spectrometry (SIMS) is a excessive spatial solution imaging mass spectrometry method, which might be used to represent the 3-dimensional chemical constitution in advanced natural and molecular structures.

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However, fullerite really stands out of the series. For the three hydrocarbons, a peak of cross-linking around 200–300 fs is rapidly followed by a relaxation of the system so that only a few tens of cross-links remain after 1 or 2 ps (Fig. 14). In contrast, for fullerite, the number of cross-links restarts to slowly increase after the peak, up to a value of ∼400 at 2 ps. In addition to the absence of “passivating” hydrogen, this is probably due to the very specific nature of fullerite, where each broken molecule naturally exhibits many reactive radical sites that are prone to induce cross-linking.

Remarkably, these simulations show that the behavior upon impact of the water nanocluster depends on other parameters such as its size and its temperature. If the temperature of the projectile is raised from 0 to 450 K, the 1 km/s impact becomes sufficient to induce its fragmentation in daughter droplets (Fig. 19d). In the same manner, an increase of the droplet size results in a lowering of the velocity needed for fragmentation as a result of the change of balance between the surface and bulk forces.

72 This observation provides a limit of depth resolution upon continuous C60 cluster bombardment. The average sputtering yield is also significantly lower for the rough surface. 15, by the fluence dependence of the surface roughness upon C60 and Au3 bombardment, for normal and 70◦ impacts. 15 also indicates that the roughness tends to saturate in all cases after a fluence of 1–2 × 1013 ions/cm2 . 16 after 50 and 200 impacts. 5 nm are induced in the surface. However, unlike what was observed in Ag, the topography development in Si did not affect the sputtering yields.

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